Scanning Ion Conductance Microscopy
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چکیده
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-force-controlled SICM is presented and a new imaging mode that significantly improves image quality is discussed.
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Scanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
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Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
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